Ключевые слова: HTS, YBCO, coated conductors, critical caracteristics, angular dependence, pinning, commercialization, MOCVD process, magnetic field dependence
Sohma M., Yamaguchi I., Kondo W., Tsukada K., Kumagai T., Yamasaki H., Arai K., Manabe T., Matsui H.
Ключевые слова: HTS, YBCO, films, substrate sapphire, FCL resistive, protection layers, fabrication, experimental results, power equipment
Ключевые слова: HTS, YBCO, films, fluorine-free process, MOD process, substrate sapphire, substrate single crystal, defects, stacking fault, pinning, co-evaporation process, critical caracteristics, Jc/B curves, angular dependence, critical current density, microstructure, fabrication, experimental results
Higuchi N., Sohma M., Yamaguchi I., Kondo W., Kumagai T., Yamasaki H., Nakagawa Y., Kaiho K., Arai K., Matsui H., Natori N.
Ключевые слова: HTS, YBCO, films large-area, MOD process, substrate sapphire, FCL resistive, matrix, shunt, short circuit test, high voltage process, power equipment
Otabe E.S., Yamada H., Yamasaki H., Mawatari Y., Minakuchi T., Nakagawa S., Kanayama K., Hirachi K., Furuta T., Takegami K.
Ключевые слова: measurement technique, HTS, YBCO, REBCO, films, current-voltage characteristics, critical caracteristics, harmonics impact
Ключевые слова: HTS, YBCO, films, FCL resistive, shunt, normal zone propagation, overcurrent, temperature distribution, experimental results, power equipment
Yamamoto T., Mawatari Y., Yamada H.(yamada@maizuru-ct.ac.jp), Minakuchi T., Itoh D., Nakagawa S., Kanayama K., Hirachi K., Yamasaki H.(hyamasak@etl.go.jp)
Ключевые слова: HTS, YBCO, films large-area, critical current density, measurement technique, critical caracteristics, harmonics impact
Yamasaki H., Nakagawa Y., Develos-Bagarinao K.(develos-bagarinao@aist.go.jp), Ohki K.
Ключевые слова: FCL resistive, shunt, HTS, YBCO, films, overcurrent, experimental results, power equipment
Furuse M., Sohma M., Yamaguchi I., Kondo W., Kumagai T., Yamasaki H., Kaiho K., Arai K., Manabe T., Nakagawa M.
Ключевые слова: HTS, YBCO, films, substrate sapphire, MOD process, shunt, current limiting characteristics, experimental results, fabrication
Ключевые слова: HTS, YBCO, films thick, substrate sapphire, buffer layers, microstructure, fabrication
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